The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 22, 2019

Filed:

May. 12, 2016
Applicant:

Microsoft Technology Licensing, Llc, Redmond, WA (US);

Inventors:

Na Gao, Beijing, CN;

Yifung Lin, Beijing, CN;

Omid Afnan, Beijing, CN;

Dian Zhang, Beijing, CN;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 9/44 (2018.01); G06F 11/36 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3664 (2013.01); G06F 11/3624 (2013.01);
Abstract

The supporting of debugging of failed vertex code on a test machine. This debugging is made possible even though the vertex code failed while on a remote processing node, and is but one of multiple, and potentially innumerable vertices that run in a distributed environment. This represents a vast technical improvement over prior ad hoc methods for trying to debug a large distributed application, since time is not wasted on vertices that operated properly, but rather debugging is focused on the problem vertex. Even reproducing the failure is a huge technical step forward.


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