The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 22, 2019
Filed:
Mar. 11, 2015
Applicant:
Ametek Precitech, Inc., Keene, NH (US);
Inventors:
Mark McNinch Walter, III, Keene, NH (US);
Edward Everett Freyenhagen, Jr., Meredith, NH (US);
Jeffrey William Roblee, Keene, NH (US);
Assignee:
Ametek Precitech, Inc., Keene, NH (US);
Primary Examiner:
Int. Cl.
CPC ...
G05B 19/27 (2006.01); G05B 19/401 (2006.01);
U.S. Cl.
CPC ...
G05B 19/27 (2013.01); G05B 19/401 (2013.01); G05B 2219/37339 (2013.01); G05B 2219/37607 (2013.01); G05B 2219/45074 (2013.01);
Abstract
A method and apparatus for treating a circumferential edge of a part are described. The method includes the steps of (1) mapping the circumferential edge of the part with a measuring device, either directly or differentially from a known shape profile; and (2) using the measured data to more accurately follow the circumferential edge of the part during subsequent treatment processing steps, thereby improving the accuracy of the treatment process and compared with a non-mapped treatment process.