The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 22, 2019

Filed:

Oct. 01, 2015
Applicant:

Leica Microsystems (Schweiz) Ag, Heerbrugg, CH;

Inventors:

Christian Marte, Dornbirn, AT;

Harald Schnitzler, Lüchingen, CH;

Reto Zuest, Diepoldsau, CH;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/24 (2006.01); G02B 21/36 (2006.01); G02B 21/02 (2006.01); G02B 21/26 (2006.01);
U.S. Cl.
CPC ...
G02B 21/24 (2013.01); G02B 21/025 (2013.01); G02B 21/248 (2013.01); G02B 21/26 (2013.01); G02B 21/362 (2013.01);
Abstract

The invention relates to a eucentric digital microscope () that encompasses a stationary stand body () and a pivot unit () mounted pivotably on the stand body (), the pivot unit () being mounted rotatably around a rotation axis () extending in a Y direction. The pivot unit () encompasses at least an optical system having an optical axis () extending orthogonally to the rotation axis (), and a focal plane (), the pivot unit () being arranged nondisplaceably at least in an X direction and in a Z direction relative to the rotation axis ().


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