The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 22, 2019
Filed:
Oct. 29, 2014
Horiba Instruments Incorporated, Irvine, CA (US);
Horiba Advanced Techno Co., Ltd., Kyoto, JP;
Adam Matthew Gilmore, Flemington, NJ (US);
Kiichiro Tomioka, Shiga-ken, JP;
HORIBA INSTRUMENTS INCORPORATED, Irvine, CA (US);
HORIBA ADVANCED TECH CO. LTD., Kyoto, JP;
Abstract
A monitoring system configured to receive an on-line sample associated with a process includes a sample chamber positioned to receive the on-line sample and a detector positioned to selectively receive and detect multiple wavelengths of light transmitted through the sample during an absorbance measurement, and emitted by the sample during a fluorescence measurement in response to illumination by each of the at least one excitation wavelength. An optical fiber couples light transmitted through the sample and directs the transmitted light to the multi-channel detector during the absorbance measurement. Optics direct light emitted by the sample during the fluorescence measurement to the detector without passing through any optical fiber. A computer in communication with the detector is configured to correct the fluorescence measurement using the absorbance measurement and determine a sample parameter based on the fluorescence and absorbance measurements of the on-line sample.