The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 22, 2019
Filed:
Jul. 08, 2016
Elwha Llc, Bellevue, WA (US);
Alistair K. Chan, Bainbridge Island, WA (US);
Geoffrey F. Deane, Bellevue, WA (US);
William D. Duncan, Sammamish, WA (US);
Philip A. Eckhoff, Kirkland, WA (US);
Bran Ferren, Beverly Hills, CA (US);
William Gates, Medina, WA (US);
W. Daniel Hillis, Cambridge, MA (US);
Roderick A. Hyde, Redmond, WA (US);
Muriel Y. Ishikawa, Livermore, CA (US);
Edward K. Y. Jung, Bellevue, WA (US);
Jordin T. Kare, San Jose, CA (US);
John Latham, Boulder, CO (US);
Max N. Mankin, Seattle, WA (US);
Nathan P. Myhrvold, Medina, WA (US);
Robert C. Petroski, Seattle, WA (US);
Clarence T. Tegreene, Mercer Island, WA (US);
David B. Tuckerman, Lafayette, CA (US);
Thomas A. Weaver, San Mateo, CA (US);
Charles Whitmer, North Bend, WA (US);
Lowell L. Wood, Jr., Bellevue, WA (US);
Victoria Y. H. Wood, Livermore, CA (US);
Elwha LLC, Bellevue, WA (US);
Abstract
A helmet testing apparatus including a movable member, a sensor coupled to the movable member and configured to acquire compliance data regarding a liner disposed within a shell of a helmet through engagement of the sensor with the liner, and a processing circuit configured to determine a rating for the helmet based on the compliance data and predetermined compliance parameters for the helmet.