The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 22, 2019

Filed:

May. 03, 2016
Applicant:

Micro-epsilon Messtechnik Gmbh & Co. KG, Ortenburg, DE;

Inventors:

Achim Sonntag, Tiefenbach, DE;

Herbert Fuellmeier, Egglham, DE;

Gerhard Kirschner, Passau, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/14 (2006.01); G01B 11/04 (2006.01); G01B 21/06 (2006.01); G01B 21/08 (2006.01); G01B 11/06 (2006.01);
U.S. Cl.
CPC ...
G01B 11/04 (2013.01); G01B 11/06 (2013.01); G01B 21/06 (2013.01); G01B 21/08 (2013.01);
Abstract

The invention relates to a device serving for the combined measurement of the width and thickness of a flat object, in particular a plate, a belt, or a web. The device comprises a measurement apparatus which has at least one contactless sensor, which is for width measurement on the object and which is movable crosswise to the longitudinal direction or conveying direction of the object. According to the invention, on the opposite side of the object, there is a second sensor opposite the first sensor which, together with the first sensor, serves for thickness measurement on the object, wherein the two sensors can travel above and below the object, that is, on opposite sides of the object.


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