The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 22, 2019
Filed:
Sep. 14, 2016
Maxphotonics Corporation, Shenzhen, CN;
Jun Song, Shenzhen, CN;
Yixin Jiang, Shenzhen, CN;
Gaofeng He, Shenzhen, CN;
Feng Jiang, Shenzhen, CN;
MAXPHOTONICS CORPORATION, Shenzhen, CN;
Abstract
The embodiments of the disclosure provide a correction method for laser marking, comprising: obtaining an image to be marked; in a preset coordinate system of a laser marker, determining a fracture region and a non-fracture region of the image to be marked; correcting the non-fracture region of the image to be marked by using a preset correcting formula; correcting the fracture region of the image to be marked by using a preset standard correction value and a preset weighted coefficient corresponding to coordinate position; and marking with the corrected image to be marked. According to the disclosure, by providing weighted correction for the mark points within the fracture region according to finely divided coordinate positions, the distortion correction for the fracture region can be completed without measuring deviation values of marking region with high density and high precision.