The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 22, 2019

Filed:

Nov. 29, 2016
Applicant:

Alcorix Co., Plainfield, IL (US);

Inventor:

Nicolaie A. Moldovan, Plainfield, IL (US);

Assignee:

Alcorix Co., Plainfield, IL (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
C23C 14/04 (2006.01); C23C 16/04 (2006.01); H01L 51/00 (2006.01); H01L 21/321 (2006.01); H01L 21/02 (2006.01); H01L 21/768 (2006.01); B24B 37/04 (2012.01); C23C 16/455 (2006.01); C23C 16/02 (2006.01); B24B 7/22 (2006.01); C23C 16/06 (2006.01); C23C 16/34 (2006.01); G21K 1/06 (2006.01);
U.S. Cl.
CPC ...
B24B 37/042 (2013.01); B24B 7/228 (2013.01); C23C 14/042 (2013.01); C23C 16/0227 (2013.01); C23C 16/042 (2013.01); C23C 16/045 (2013.01); C23C 16/06 (2013.01); C23C 16/342 (2013.01); C23C 16/45529 (2013.01); C23C 16/45555 (2013.01); G21K 1/06 (2013.01); H01L 21/02065 (2013.01); H01L 21/32115 (2013.01); H01L 21/7684 (2013.01); H01L 51/0011 (2013.01); B81C 2201/0104 (2013.01); G21K 2201/067 (2013.01); Y10S 148/05 (2013.01);
Abstract

A method for fabrication of diffractive optics by batch processing is disclosed, having applicability to high resolution ultra-high aspect ratio Fresnel Zone Plates for focusing of X-rays or gamma-rays having energies up to hundreds of keV. An array of precursor forms is etched into a planar substrate. Sidewalls of the forms are smoothed to a required surface roughness. A sequence of alternating layers of different complex refractive index, for binary or higher order diffractive optics, are deposited on the precursor forms by atomic layer deposition (ALD), to provide diffractive line patterns. Thinnest layers may have nanometer thicknesses. After front surface planarization and thinning of the substrate to expose first and second surfaces of the diffractive line patterns of the diffractive optic, the height h in the propagation direction provides a designed absorption difference and/or phase shift difference between adjacent diffractive lines. Optionally, post-processing enhances mechanical, thermal, electrical and optical properties.


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