The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 15, 2019
Filed:
Nov. 19, 2010
Applicants:
Morteza Gharib, Pasadena, CA (US);
Alexei Harvard, Pasadena, CA (US);
Scott Hsieh, Monrovia, CA (US);
Jian LU, Monrovia, CA (US);
Inventors:
Morteza Gharib, Pasadena, CA (US);
Alexei Harvard, Pasadena, CA (US);
Scott Hsieh, Monrovia, CA (US);
Jian Lu, Monrovia, CA (US);
Assignee:
CALIFORNIA INSTITUTE OF TECHNOLOGY, Pasadena, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 13/207 (2018.01); H04N 13/02 (2006.01); G06T 7/70 (2017.01); G06T 7/593 (2017.01);
U.S. Cl.
CPC ...
H04N 13/207 (2018.05); G06T 7/593 (2017.01); G06T 7/70 (2017.01); H04N 13/0214 (2013.01); G06T 2207/10024 (2013.01); G06T 2207/10028 (2013.01); G06T 2207/20016 (2013.01); G06T 2207/30036 (2013.01); G06T 2207/30244 (2013.01);
Abstract
Hardware and software configurations, optionally, for performing profilometry of an object are disclosed. An advantageous imaging device is described. An advantageous approach to determining imager position is also described. Each aspect described may be used independently of the other. Moreover, the teaching may find use in other fields including velocimetry, etc.