The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 15, 2019
Filed:
Sep. 11, 2015
Applicant:
Flir Systems, Inc., Wilsonville, OR (US);
Inventors:
Joseph Kostrzewa, Buellton, CA (US);
Bruce Covington, Santa Barbara, CA (US);
Chris Posch, Santa Barbara, CA (US);
Assignee:
FLIR Systems, Inc., Wilsonville, OR (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 5/33 (2006.01); H04N 5/225 (2006.01);
U.S. Cl.
CPC ...
H04N 5/33 (2013.01); H04N 5/2253 (2013.01); H04N 5/2257 (2013.01);
Abstract
Various embodiments of the present disclosure may include a focal plane array configured to capture thermal image data from a scene. The embodiments may further include a sensor window displaced a first distance from the focal plane array. The embodiments may also include a protective window displaced a second distance greater than the first distance from the focal plane array, wherein the second distance causes damage or debris incident on the protective window to be out of focus in the thermal image data.