The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 15, 2019

Filed:

May. 22, 2015
Applicant:

Seiko Epson Corporation, Tokyo, JP;

Inventors:

Tomoki Harada, Matsumoto, JP;

Koichi Hashimoto, Sendai, JP;

Shogo Arai, Sendai, JP;

Toshiki Boshu, Sendai, JP;

Assignee:
Attorney:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 7/60 (2017.01); H04N 13/275 (2018.01); G01B 11/25 (2006.01); G06T 7/593 (2017.01); H04N 13/02 (2006.01);
U.S. Cl.
CPC ...
G06T 7/602 (2013.01); G01B 11/2545 (2013.01); G06T 7/593 (2017.01); H04N 13/275 (2018.05); G06T 2207/10012 (2013.01); G06T 2207/10028 (2013.01); G06T 2207/20021 (2013.01);
Abstract

A control apparatus includes a projection unit configured to project a first pattern onto an object; and a selection unit configured to select a single first pattern from a plurality of first patterns. After the projection unit projects each of the plurality of first patterns having different resolutions onto the object, the projection unit projects a second pattern onto the object, the second pattern having the same resolution as that of the selected single first pattern.


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