The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 15, 2019
Filed:
Nov. 07, 2016
National Technology & Engineering Solutions of Sandia, Llc, Albuquerque, NM (US);
Michael Joseph Haass, Albuquerque, NM (US);
Andrew T. Wilson, Albuquerque, NM (US);
Mark Daniel Rintoul, Albuquerque, NM (US);
National Technology & Engineering Solutions of Sandia, LLC, Albuquerque, NM (US);
Abstract
Described herein are various technologies pertaining to analysis of eye tracking data. A head and/or eyes of an observer who is viewing a visual stimulus is monitored, and eye tracking data that is representative of the path of the eyes of the observer over time (a scanpath) is generated. The eye tracking data is time-series data that defines the location of the focal point, or other measurable characteristics, of the eyes of the observer on the visual stimulus over time. A feature vector is constructed based upon the eye tracking data, where the feature vector is representative of the eye tracking data, and is thus representative of the scanpath. The feature vector is compared with other feature vectors to identify scanpaths that correspond to the scanpath represented by the feature vector.