The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 15, 2019

Filed:

Jul. 15, 2013
Applicant:

The Boeing Company, Chicago, IL (US);

Inventors:

David H. Jones, Bellevue, WA (US);

Tyler J. Petri, Seattle, WA (US);

Daniel J. Fogarty, Mukilteo, WA (US);

Chad R. Douglas, Shoreline, WA (US);

Roger Nicholson, Everett, WA (US);

Lars Fucke, Madrid, ES;

Stephen Sweeney, Madrid, ES;

Ricardo M. Fricks, Lake Stevens, WA (US);

Kevin Nicholas King, Mill Creek, WA (US);

Assignee:

The Boeing Company, Chicago, IL (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06G 7/48 (2006.01); G06F 17/50 (2006.01); G05B 23/02 (2006.01);
U.S. Cl.
CPC ...
G06F 17/5009 (2013.01); G05B 23/0251 (2013.01); Y02T 10/82 (2013.01);
Abstract

A failure-effect validation system includes an effects modeler configured to develop a cumulative effects model for failure modes of the complex system, and by which a model of the complex system is extendible to form an extended complex-system model. The effects modeler is also configured to develop search targets each of which includes logical expressions of notable hazards and other factors that contribute to the cumulative effects, such as crew workload, safety margin and/or physiological effects. A model analysis system is configured to perform an automated analysis using the extended complex-system model and search targets, and in which the automated analysis includes a graph search of possible states of the extended complex-system model to locate search targets. And the effects assessment system is configured to selectively generate a layout of failure analysis data including at least a portion of the extended complex-system model and results of the automated analysis.


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