The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 15, 2019

Filed:

Jul. 29, 2010
Applicants:

Ilya D. Rosenberg, Mountain View, CA (US);

Julien G. Beguin, San Francisco, CA (US);

Kenneth H. Perlin, New York, NY (US);

Inventors:

Ilya D. Rosenberg, Mountain View, CA (US);

Julien G. Beguin, San Francisco, CA (US);

Kenneth H. Perlin, New York, NY (US);

Assignee:

Amazon Technologies, Inc., Seattle, WA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 3/041 (2006.01); G06F 3/045 (2006.01);
U.S. Cl.
CPC ...
G06F 3/0414 (2013.01); G06F 3/041 (2013.01); G06F 3/045 (2013.01); G06F 3/0416 (2013.01);
Abstract

A hardware enabled interpolating sensor allows for anti-aliased acquisition of data. Electrodes coupled with resistive material are disposed on either side of a transducer material, such that an impinging signal varies the electrical characteristics of the transducer material. A controller scans the electrodes and analyzes the variation in the electrical characteristics to generate data. Based upon the known characteristics of the resistive material, an interpolated image is generated from the data which is inherently anti-aliased. Additionally, an interpolating display comprising electrodes disposed on either side of an emission material is described, which allows for emission regions of varying intensity, area, and so forth.


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