The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 15, 2019

Filed:

Nov. 13, 2015
Applicant:

Rohde & Schwarz Gmbh & Co. KG, Munich, DE;

Inventor:

Werner Perndl, Zorneding, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/317 (2006.01); G01R 1/067 (2006.01); G01R 21/133 (2006.01);
U.S. Cl.
CPC ...
G01R 31/31721 (2013.01); G01R 1/06705 (2013.01); G01R 21/133 (2013.01);
Abstract

A measuring system for performing measurements on a device under test is provided. The measuring system comprises a measuring device, a probe connected to the measuring device, a power sensor and a positioning unit. The positioning unit is adapted to connect the probe to the power sensor in a first configuration and to the device under test in a second configuration. The measuring device is adapted to generate a first signal. The probe is adapted to supply the first signal to the power sensor and the first configuration and to supply the first signal to the device under test and the second configuration. The power sensor is adapted to determine the power of the first signal and the first configuration. The measuring device is adapted to regulate the power of the first signal in the second configuration based upon the power determined by the power sensor.


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