The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 15, 2019
Filed:
Apr. 30, 2015
Keysight Technologies, Inc., Minneapolis, MN (US);
Jonathan Helfman, Half Moon Bay, CA (US);
Stanley T. Jefferson, Palo Alto, CA (US);
Thomas R. Fay, Fort Collins, CO (US);
Keysight Technologies, Inc., Santa Rosa, CA (US);
Abstract
A method of operating a data processing system to operate a first instrument and a second instrument connected to the data processing system is disclosed. The method includes displaying a measurement table. The data processing system receives user input defining a first parameter that is to be varied during a testing procedure by the first instrument and a first measurement to be made by the second instrument during the test procedure, a plurality of first parameter values to be used in the testing procedure. The data processing system causes the first instrument to provide each of the first parameter values and the second instrument to make the measurement and enter the measurement in a corresponding cell of a second row in the measurement table when the first instrument provides each of the first parameter values.