The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 15, 2019

Filed:

Oct. 29, 2013
Applicant:

Sri International, Menlo Park, NJ (US);

Inventors:

David S. Stoker, Belmont, CA (US);

Erik Frank Matlin, Los Gatos, CA (US);

Motilal Agrawal, San Carlos, CA (US);

James R. Potthast, San Jose, CA (US);

Neil William Troy, Santa Clara, CA (US);

Assignee:

SRI International, Menlo Park, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/95 (2006.01); G06F 17/50 (2006.01); G01R 31/311 (2006.01);
U.S. Cl.
CPC ...
G01N 21/95 (2013.01); G01R 31/311 (2013.01); G06F 17/5081 (2013.01);
Abstract

A method and apparatus for scanning an integrated circuit comprising a plurality of time-synchronized laser microscopes, each of which is configured to scan the same field of view of an integrated circuit under test that generates a plurality of images of the integrated circuit under test, a data processor, coupled to the laser scanning microscope, for processing the plurality of images, comprising, a netlist extractor (NE) that produces one or more netlists defining structure of the integrated circuit under test.


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