The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 15, 2019
Filed:
Dec. 24, 2014
Applicant:
Jfe Steel Corporation, Tokyo, JP;
Inventors:
Hiroaki Ono, Tokyo, JP;
Toshifumi Kodama, Tokyo, JP;
Takahiro Koshihara, Tokyo, JP;
Akihiro Ogawa, Tokyo, JP;
Yukinori Iizuka, Tokyo, JP;
Assignee:
JFE Steel Corporation, , JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/00 (2006.01); G01N 21/88 (2006.01); G01N 21/892 (2006.01); G01N 21/952 (2006.01); G06T 7/70 (2017.01); G06K 9/46 (2006.01); G06K 9/62 (2006.01); G06T 7/00 (2017.01); H04N 7/01 (2006.01); G01B 11/245 (2006.01);
U.S. Cl.
CPC ...
G01N 21/8851 (2013.01); G01B 11/245 (2013.01); G01N 21/892 (2013.01); G01N 21/952 (2013.01); G06K 9/4604 (2013.01); G06K 9/6267 (2013.01); G06T 7/0004 (2013.01); G06T 7/70 (2017.01); H04N 7/01 (2013.01); G01N 2021/8822 (2013.01); G01N 2021/8887 (2013.01); G01N 2201/063 (2013.01); G06T 2207/20224 (2013.01); G06T 2207/30164 (2013.01);
Abstract
A surface defect detecting method of optically detecting a surface defect of a steel material includes: an irradiation step of irradiating an examination target part with illumination light beams from different directions by using two or more distinguishable light sources; and a detection step of obtaining images by reflected light beams of the respective illumination light beams and detecting a surface defect in the examination target part by executing subtraction processing between the obtained images.