The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 15, 2019
Filed:
Jan. 22, 2015
Applicant:
Microtracbel Corp., Osaka, JP;
Inventors:
Kazuyuki Nakai, Osaka, JP;
Hiromi Yamazaki, Osaka, JP;
Kaori Nakamura, Osaka, JP;
Takayuki Goumoto, Osaka, JP;
Assignee:
MicrotracBEL Corp., Osaka, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 9/26 (2006.01); G01N 9/00 (2006.01);
U.S. Cl.
CPC ...
G01N 9/26 (2013.01); G01N 9/00 (2013.01);
Abstract
This true density measurement device is a device for measuring the true density of a sample by a gas phase substitution method, and is provided with a sample chamber for housing the sample, and a lid for providing closure to an opening of the sample chamber. The lid is a non-rotating lid that is pressed against the rim of the opening to hermetically seal the sample chamber.