The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 15, 2019

Filed:

Jun. 08, 2015
Applicant:

Mts Systems Corporation, Eden Prairie, MN (US);

Inventors:

Byron John Saari, Minneapolis, MN (US);

Paul Eric Meybaum, Maple Grove, MN (US);

Assignee:

MTS Systems Corporation, Eden Prairie, MN (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 1/04 (2006.01); G01N 3/18 (2006.01);
U.S. Cl.
CPC ...
G01N 1/04 (2013.01); G01N 3/18 (2013.01); G01N 2203/0222 (2013.01); G01N 2203/0226 (2013.01);
Abstract

An environmental chamber includes an enclosure having opposed walls each wall having an aperture of size to receive a test specimen support therethrough. The apertures are aligned with each other along on a reference axis. A forced air source is configured to supply forced air in a direction to intersect with the reference axis within the enclosure. A diverter is positioned between the forced air source and the reference axis. The diverter is configured to receive the forced air and control the air flow past different portions of the reference axis. The environmental chamber is used with a load frame having test specimen supports extending into the opposed apertures. A method of directing more force air at the test specimen supports than at at least a portion of the test specimen to maintain a selected temperature gradient in the test specimen is also provided.


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