The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 15, 2019

Filed:

Jun. 30, 2017
Applicant:

Spectrasensors, Inc., Rancho Cucamonga, CA (US);

Inventors:

Xiang Liu, Rancho Cucamonga, CA (US);

Gary Yeh, Rancho Cucamonga, CA (US);

Adam S. Chaimowitz, Rancho Cucamonga, CA (US);

William Jenko, Rancho Cucamonga, CA (US);

Alfred Feitisch, Los Gatos, CA (US);

Assignee:

SpectraSensors, Inc., Rancho Cucamonga, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01J 3/00 (2006.01); G01J 3/28 (2006.01); G01N 21/27 (2006.01); G01N 21/39 (2006.01);
U.S. Cl.
CPC ...
G01J 3/28 (2013.01); G01N 21/274 (2013.01); G01J 2003/283 (2013.01); G01J 2003/2866 (2013.01); G01N 21/39 (2013.01);
Abstract

A frequency registration deviation is quantified for a field spectrum collected during analysis by a spectroscopic analysis system of a sample fluid when the spectroscopic analysis system has deviated from a standard calibration state. The field spectrum is corrected based on the frequency registration deviation using at least one spectral shift technique, and a concentration is calculated for at least one analyte represented by the field spectrum using the corrected field spectrum. Related systems, methods, and articles are described.


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