The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 15, 2019

Filed:

Mar. 11, 2016
Applicant:

Us Synthetic Corporation, Orem, UT (US);

Inventors:

Tyler Scott Dunaway, Pleasant Grove, UT (US);

Greg Carlos Topham, Spanish Fork, UT (US);

Renato Ventura, Provo, UT (US);

Assignee:

US SYNTHETIC CORPORATION, Orem, UT (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); C25F 7/00 (2006.01); G01N 23/04 (2018.01); C25F 3/02 (2006.01);
U.S. Cl.
CPC ...
C25F 7/00 (2013.01); C25F 3/02 (2013.01); G01N 23/04 (2013.01);
Abstract

Embodiments disclosed herein are directed to methods and systems for X-ray imaging and/or inspection of a PCD element in a protective leaching cup, which may be placed in a tray. Embodiments include inspection of one or more characteristics between the protective leaching cup and the PCD element prior to and/or after leaching of the PCD element. Embodiments also include using X-ray imaging to assist with positioning the PCD element in the protective leaching cup. Embodiments further include inspection of one or more defects in the PCD element during processing and/or after usage by X-ray technique.


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