The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 08, 2019

Filed:

Jul. 13, 2015
Applicants:

Gabriela F. Ciocarlie, New York, NY (US);

Angelos Stavrou, Springfield, VA (US);

Salvatore J. Stolfo, Ridgewood, NJ (US);

Angelos D. Keromytis, New York, NY (US);

Inventors:

Gabriela F. Ciocarlie, New York, NY (US);

Angelos Stavrou, Springfield, VA (US);

Salvatore J. Stolfo, Ridgewood, NJ (US);

Angelos D. Keromytis, New York, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 29/06 (2006.01); G06N 99/00 (2010.01);
U.S. Cl.
CPC ...
H04L 63/1425 (2013.01); G06N 99/005 (2013.01); H04L 63/14 (2013.01);
Abstract

Systems, methods, and media for generating sanitized data, sanitizing anomaly detection models, and generating anomaly detection models are provided. In some embodiments, methods for sanitizing anomaly detection models are provided. The methods including: receiving at least one abnormal anomaly detection model from at least one remote location; comparing at least one of the at least one abnormal anomaly detection model to a local normal detection model to produce a common set of features common to both the at least one abnormal anomaly detection model and the local normal detection model; and generating a sanitized normal anomaly detection model by removing the common set of features from the local normal detection model.


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