The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 08, 2019
Filed:
Oct. 06, 2017
Applicant:
Rohde & Schwarz Gmbh & Co. KG, Munich, DE;
Inventors:
Johannes Koebele, Offenburg, DE;
Thorsten Hertel, San Jose, CA (US);
Assignee:
Rohde & Schwarz GmbH & Co. KG, Munich, DE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 17/16 (2015.01); H04B 17/15 (2015.01); H04B 17/10 (2015.01); H04B 17/19 (2015.01);
U.S. Cl.
CPC ...
H04B 17/15 (2015.01); H04B 17/102 (2015.01);
Abstract
A test system for over the air (OTA) measurements of a device under test (DUT) with a dynamic adjustable grid is provided. The system comprises a device under test (DUT), at least one positioner, at least one measurement antenna, and at least one measuring/control device. The measurement antenna is configured to measure several defined measurement points with regard to the device under test, wherein the measurement points are arranged in a grid around the device under test. The configuration of the grid depends on an input value received by the measuring/control device.