The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 08, 2019

Filed:

Jun. 21, 2016
Applicant:

Analog Devices, Inc., Norwood, MA (US);

Inventors:

James Zhao, San Francisco, CA (US);

Javier Alejandro Salcedo, North Billerica, MA (US);

Srivatsan Parthasarathy, Acton, MA (US);

Assignee:

ANALOG DEVICES, INC., Norwood, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H02H 9/04 (2006.01); H01L 27/02 (2006.01);
U.S. Cl.
CPC ...
H02H 9/046 (2013.01); H01L 27/0262 (2013.01); H02H 9/044 (2013.01); H01L 2224/48091 (2013.01); H01L 2224/48145 (2013.01); H01L 2224/48247 (2013.01); H01L 2924/181 (2013.01);
Abstract

Apparatus and methods for actively-controlled trigger and latch release thyristor are provided. In certain configurations, an actively-controlled protection circuit includes an overvoltage sense circuit, a thyristor or silicon controlled rectifier (SCR) that is electrically connected between a signal node and a discharge node, and an active trigger and latch release circuit. The overvoltage sense circuit controls a voltage of a dummy supply node based on a voltage of the signal node, and the active trigger and latch release circuit detects presence of a transient overstress event at the signal node based on the voltage of the dummy supply node. The active trigger and latch release circuit provides one or more trigger signals to the SCR to control the SCR's activation voltage, and the active trigger and latch release circuit activates or deactivates the one or more trigger signals based on whether or not the transient overstress event is detected.


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