The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 08, 2019
Filed:
Dec. 15, 2016
Toshihiro Ishii, Miyagi, JP;
Yoichiro Takahashi, Miyagi, JP;
Sunao Chubachi, Miyagi, JP;
Masayuki Fujiwara, Miyagi, JP;
Toshihide Sasaki, Kanagawa, JP;
Kazuhiko Adachi, Miyagi, JP;
Toshihiro Ishii, Miyagi, JP;
Yoichiro Takahashi, Miyagi, JP;
Sunao Chubachi, Miyagi, JP;
Masayuki Fujiwara, Miyagi, JP;
Toshihide Sasaki, Kanagawa, JP;
Kazuhiko Adachi, Miyagi, JP;
RICOH COMPANY, LTD., Tokyo, JP;
Abstract
An optical sensor, an optical examination device, and a method of detecting optical properties. The optical sensor includes an irradiation system including light irradiator to irradiate a test object with light, and a detection system to detect the light that is emitted from the irradiation system to the test object and has propagated through the test object. The light irradiator includes a multilayered structure having an active layer, and the multilayered structure includes a surface-emitting laser element and a photo-sensing element optically connected to the surface-emitting laser element. The optical examination device includes the optical sensor, and a controller to calculate optical properties of the test object based on a detection result of the optical sensor. The method includes performing optical simulation to obtain a detection light quantity distribution for an optical model and performing inverse problem estimation.