The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 08, 2019
Filed:
Sep. 18, 2015
Applicant:
Sumitomo Chemical Company, Limited, Tokyo, JP;
Inventors:
Koji Kashu, Niihama, JP;
Yusuke Kon, Daegu, KR;
Tatsuya Sakamoto, Niihama, JP;
Jian Wang, Daegu, KR;
Assignee:
SUMITOMO CHEMICAL COMPANY, LIMITED, Tokyo, JP;
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/894 (2006.01); H01M 2/14 (2006.01); B26D 7/14 (2006.01); B26D 7/26 (2006.01); B65H 16/10 (2006.01); B65H 18/08 (2006.01); B65H 26/02 (2006.01); G01N 21/892 (2006.01); G03B 1/04 (2006.01); G03B 1/42 (2006.01); G03B 1/56 (2006.01); G03B 17/30 (2006.01); G03B 17/42 (2006.01); G03B 21/32 (2006.01); H01M 10/0525 (2010.01); B26D 1/03 (2006.01); H01M 2/16 (2006.01); G03B 17/00 (2006.01); G03B 21/00 (2006.01);
U.S. Cl.
CPC ...
H01M 2/145 (2013.01); B26D 1/035 (2013.01); B26D 7/14 (2013.01); B26D 7/2614 (2013.01); B65H 16/10 (2013.01); B65H 18/08 (2013.01); B65H 26/02 (2013.01); G01N 21/892 (2013.01); G01N 21/894 (2013.01); G03B 1/04 (2013.01); G03B 1/42 (2013.01); G03B 1/56 (2013.01); G03B 17/30 (2013.01); G03B 17/425 (2013.01); G03B 21/328 (2013.01); H01M 2/1653 (2013.01); H01M 2/1686 (2013.01); H01M 10/0525 (2013.01); B65H 2557/62 (2013.01); G03B 17/00 (2013.01); G03B 21/00 (2013.01); G03B 2217/243 (2013.01); H01M 2/166 (2013.01);
Abstract
A method for film production includes the steps of obtaining information on the position of a defect (D) in a separator () and providing marks (LA, LB) at the respective positions in the vicinity of the defect (D), the marks indicating the position of the defect.