The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 08, 2019

Filed:

Oct. 16, 2017
Applicant:

Toyota Jidosha Kabushiki Kaisha, Toyota-shi, Aichi, JP;

Inventors:

Teruaki Kumazawa, Toyota, JP;

Narumasa Soejima, Nagakute, JP;

Yuichi Takeuchi, Kariya, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 21/04 (2006.01); H01L 21/285 (2006.01); H01L 29/47 (2006.01); H01L 29/66 (2006.01); H01L 29/06 (2006.01); H01L 29/16 (2006.01); H01L 29/872 (2006.01);
U.S. Cl.
CPC ...
H01L 29/47 (2013.01); H01L 21/0465 (2013.01); H01L 21/0495 (2013.01); H01L 21/28537 (2013.01); H01L 21/28581 (2013.01); H01L 29/0619 (2013.01); H01L 29/1608 (2013.01); H01L 29/6606 (2013.01); H01L 29/66143 (2013.01); H01L 29/872 (2013.01);
Abstract

A method of manufacturing a semiconductor device includes: setting a plurality of main semiconductor wafers and a plurality of sub semiconductor wafers in a load lock chamber of an electrode forming equipment; repeating a wafer-transfer and electrode-formation process of transferring at least one of the main semiconductor wafers from the load lock chamber to the film formation chamber in a state where the load lock chamber and the film formation chamber are decompressed and then forming a surface electrode on a surface of the at least one main semiconductor wafer transferred in the film formation chamber; removing the main semiconductor wafers on which the surface electrodes have been formed and the sub semiconductor wafers from the electrode forming equipment without forming an electrode on the sub semiconductor wafers by the electrode forming equipment; and making the surface electrodes Schottky-contact the main semiconductor wafers.


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