The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 08, 2019

Filed:

Aug. 21, 2017
Applicant:

Mitsubishi Chemical Corporation, Tokyo, JP;

Inventors:

Kenji Iso, Tokyo, JP;

Hiromitsu Kimura, Tokyo, JP;

Yuya Saito, Tokyo, JP;

Yuuki Enatsu, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 29/04 (2006.01); C30B 25/04 (2006.01); C23C 16/34 (2006.01); H01L 21/02 (2006.01); H01L 29/06 (2006.01); C30B 29/40 (2006.01);
U.S. Cl.
CPC ...
H01L 29/045 (2013.01); C23C 16/34 (2013.01); C30B 25/04 (2013.01); C30B 29/406 (2013.01); H01L 21/02389 (2013.01); H01L 21/02516 (2013.01); H01L 21/02647 (2013.01); H01L 29/0603 (2013.01);
Abstract

A C-plane GaN substrate only mildly restricts the shape and dimension of a nitride semiconductor device formed on the substrate. The variation of an off-angle on the main surface of the substrate is suppressed. In the C-plane GaN substrate: the substrate comprises a plurality of facet growth areas each having a closed ring outline-shape on the main surface; the number density of the facet growth area accompanied by a core among the plurality of facet growth areas is less than 5 cmon the main surface; and, when any circular area of 4 cm diameter is selected from an area which is on the main surface and is distant by 5 mm or more from the outer peripheral edge of the substrate, the variation widths of an a-axis direction component and an m-axis direction component of an off-angle within the circular area is each 0.25 degrees or less.


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