The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 08, 2019

Filed:

Apr. 27, 2018
Applicant:

Griff Technologies, Inc., Milton, MA (US);

Inventors:

Elmar Swiegot, Wertheim, DE;

Alan Shinn, Berkeley, CA (US);

Chiko Fan, San Jose, CA (US);

David King, Pleasanton, CA (US);

Elias Elias, Milton, MA (US);

Assignee:

Sage Vision, Inc., Milton, MA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 7/60 (2017.01); G06T 7/73 (2017.01);
U.S. Cl.
CPC ...
G06T 7/60 (2013.01); G06T 7/73 (2017.01); G06T 2207/10024 (2013.01);
Abstract

A system for determining the absolute position of a first object with respect to a second object includes a scalar element attached to the first object and a measuring device attached to the second object. The scalar element comprises a series of coded regions. The coded region represents a number designating a position along an axis of the scalar element. The measuring device includes a two-dimensional optical sensor array configured to capture an image of a portion of the scalar element. The system also includes a processor configured to receive the image and determine an absolute position of the first object with respect to the second object based on at least one coded region of the series of coded regions.


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