The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 08, 2019
Filed:
Dec. 21, 2015
Canon Kabushiki Kaisha, Tokyo, JP;
James Austin Besley, Killara, AU;
Peter Alleine Fletcher, Rozelle, AU;
Steven David Webster, Scotland Island, AU;
CANON KABUSHIKI KAISHA, Tokyo, JP;
Abstract
A method for processing microscopy images captures, for each of a first microscopy slide and a second microscopy slide, a plurality of partial spectrum images under multiple optical configurations where each image captures a different portion of the spectrum of the slide. First and second partial spectrum images associated with different optical configuration are selected and used to reconstruct respectively a combined spectrum image of part of the first microscopy slide and a combined spectrum image of at least part of the second microscopy slide, thereby forming a first pair of partial spectrum images. The method determines a distortion map by aligning images derived from the first pair of the partial spectrum images.