The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 08, 2019
Filed:
May. 23, 2014
Applicant:
S.d. Sight Diagnostics Ltd., Jerusalem, IL;
Inventors:
Yuval Greenfield, Tel Aviv, IL;
Yonatan Bilu, Jerusalem, IL;
Joseph Joel Pollak, Alon Shvut, IL;
Noam Yorav-Raphael, Efrat, IL;
Assignee:
S.D. SIGHT DIAGNOSTICS LTD., Jerusalem, IL;
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G02B 21/36 (2006.01); G02B 21/16 (2006.01); G02B 7/38 (2006.01); G02B 21/24 (2006.01); G06T 7/507 (2017.01);
U.S. Cl.
CPC ...
G06T 7/0012 (2013.01); G02B 7/38 (2013.01); G02B 21/16 (2013.01); G02B 21/244 (2013.01); G02B 21/361 (2013.01); G02B 21/367 (2013.01); G06T 7/507 (2017.01); G06T 2207/10056 (2013.01); G06T 2207/30024 (2013.01);
Abstract
The present disclosure provides a method of determining a reference depth level within a cell sample. The method comprises obtaining data representative of a series of images captured by performing a depth scan of the cell sample using a digital microscope, the series of images being associated with a series of depth levels of the cell sample; processing said data for detecting at least one depth level corresponding to a drop in image contrast; and identifying the detected depth level as the reference depth level.