The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 08, 2019

Filed:

Dec. 06, 2016
Applicant:

Dassault Systemes, Velizy Villacoublay, FR;

Inventors:

Malika Boulkenafed, Courbevoie, FR;

Fabrice Michel, Grabels, FR;

Asma Rejeb Sfar, Paris, FR;

Assignee:

DASSAULT SYSTEMES, Velizy Villacoublay, FR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06K 9/62 (2006.01); G06F 17/50 (2006.01); G06N 3/04 (2006.01); G06N 3/08 (2006.01); G06K 9/46 (2006.01);
U.S. Cl.
CPC ...
G06K 9/6269 (2013.01); G06F 17/50 (2013.01); G06K 9/00208 (2013.01); G06K 9/6215 (2013.01); G06K 9/6274 (2013.01); G06N 3/04 (2013.01); G06N 3/08 (2013.01); G06K 9/4628 (2013.01);
Abstract

The invention notably relates to a computer-implemented method for recognizing a three-dimensional modeled object from a two-dimensional image. The method comprises providing a first set of two-dimensional images rendered from three-dimensional modeled objects, each two-dimensional image of the first set being associated to a label; providing a second set of two-dimensional images not rendered from three-dimensional objects, each two-dimensional image of the second set being associated to a label; training a model on both first and second sets; providing a similarity metric; submitting a two-dimensional image depicting at least one object; and retrieving a three-dimensional object similar to the said at least one object of the two-dimensional image submitted by using the trained model and the similarity metric.


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