The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 08, 2019

Filed:

Dec. 04, 2017
Applicant:

Honeywell International Inc., Morris Plains, NJ (US);

Inventors:

Kevin McMurdie, Surprise, AZ (US);

Ganesh P. Gadhe, Pune, IN;

Assignee:

Honeywell International Inc., Morris Plains, NJ (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 29/06 (2006.01); G06F 21/56 (2013.01); G06F 21/55 (2013.01); G06F 21/57 (2013.01); G05B 13/04 (2006.01); G05B 13/02 (2006.01); G06Q 10/06 (2012.01); G05B 15/02 (2006.01);
U.S. Cl.
CPC ...
G06F 21/56 (2013.01); G05B 13/0265 (2013.01); G05B 13/04 (2013.01); G06F 21/552 (2013.01); G06F 21/577 (2013.01); G06Q 10/0635 (2013.01); G05B 15/02 (2013.01);
Abstract

This disclosure provides a security system and method for using machine learning to improve cybersecurity operations in an industrial control networks and other systems. A method includes collecting, by a security system, current process information for a plurality of processes in a control system. The method includes analyzing, by the security system, the current process information according to one or more process models. The method includes producing, by the security system and according to the analysis, a risk report that identifies an abnormal process among the plurality of processes.


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