The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 08, 2019
Filed:
Aug. 31, 2017
Intuit Inc., Mountain View, CA (US);
Vijay Thomas, Mountain View, CA (US);
Amit Ksirsagar, Mountain View, CA (US);
Swathi Singireddy, Santa Clara, CA (US);
Sharath Nagaraj Dwaral, Mountain View, CA (US);
Hadik Parekh, Mountain View, CA (US);
Sumeet Chandra, Mountain View, CA (US);
Jiajie Duan, Mountain View, CA (US);
Intuit Inc., Mountain View, CA (US);
Abstract
The present disclosure relates to autogenic software testing. In some embodiments, a method of the present disclosure includes scanning source code to identify one or more methods to be tested. The method further includes generating one or more test cases which perform requests using the one or more methods. The method further includes generating one or more logs comprising results of the requests. The method further includes scanning the one or more logs to identify a pattern associated with a request. The method further includes determining that the pattern is not stored in a test data store. The method further includes generating a first test and a first expected response based on the pattern. The method further includes storing the first test and the first expected response in the test data store. The first test may be executed and evaluated based on the first expected response.