The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 08, 2019
Filed:
Feb. 16, 2017
International Business Machines Corporation, Armonk, NY (US);
Si Bin Fan, Beijing, CN;
Xiao Feng Guan, Shanghai, CN;
Chen Jiang, Beijing, CN;
Yan Rong Shen, Beijing, CN;
Chang Ning Song, Beijing, CN;
Ping Xiao, Beijing, CN;
INTERNATIONAL BUSINESS MACHINES CORPORATION, Armonk, NY (US);
Abstract
A computer implemented method for selecting breakpoints for cross-layer debugging is provided. The method includes receiving code comprising a plurality of layers, and executing a static analysis of the code to obtain a use-definition (UD) chain, alias information, and a parameter mapping for each of the plurality of layers. The method also includes determining a statement of the code that produces one of an error and a failure, and generating a table comprising a plurality of fields including a working statement field, watching variable field, and a watching function field. The method includes adding the determined statement to the working statement field and performing a cross-layer analysis includes identifying at least one used variable and its associated alias as watching variables from the added working statement, searching the code based on the watching variable field. The method includes generating cross-layer suspect code points based on the cross-layer analysis.