The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 08, 2019

Filed:

Jul. 14, 2016
Applicant:

Emc Ip Holding Company Llc, Hopkinton, MA (US);

Inventors:

Michael John Dutch, Los Gatos, CA (US);

Christopher Hercules Claudatos, San Jose, CA (US);

Mandavilli Navneeth Rao, Santa Clara, CA (US);

Assignee:

EMC IP Holding Company LLC, Hopkinton, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 11/14 (2006.01); G06F 17/30 (2006.01);
U.S. Cl.
CPC ...
G06F 11/1451 (2013.01); G06F 11/1469 (2013.01); G06F 17/30082 (2013.01); G06F 11/1453 (2013.01); G06F 2201/80 (2013.01); G06F 2201/805 (2013.01);
Abstract

A method, article of manufacture, and apparatus for processing data. In some embodiments, this includes analyzing a first container at a block level, determining a first level of granularity based on the analysis of the first container, based on the first level of granularity, identifying a first set of data objects, storing metadata of the first set of data objects in a recovery catalog, based on the first set of data objects, identifying a second container, analyzing the second container at a block level, determining a second level of granularity based on the analysis of the second container, based on the second level of granularity, identifying a second set of data objects, storing metadata of the second set of data objects in the recovery catalog, wherein the recovery catalog is stored in a storage device.


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