The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 08, 2019

Filed:

Jun. 16, 2014
Applicant:

Tidal Systems, Inc., Santa Clara, CA (US);

Inventors:

Yingquan Wu, Palo Alto, CA (US);

Armin Banaei, Sunnyvale, CA (US);

Assignee:

Tidal Systems, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H03M 13/00 (2006.01); G06F 11/10 (2006.01); H03M 13/11 (2006.01); H03M 13/37 (2006.01);
U.S. Cl.
CPC ...
G06F 11/1068 (2013.01); H03M 13/1111 (2013.01); H03M 13/3723 (2013.01); H03M 13/6325 (2013.01);
Abstract

A method is disclosed for performing LDPC soft decoding of data stored in a flash storage device. Upon occurrence of a hard read failure, one or more retries with soft decoding after each retry are performed until soft decoding is successful or a maximum iteration count is reached. For each retry thresholds for sensing a level of a cell are adjusted according to a specific sequence. Likewise, the LLR table for each retry is selected from pre-determined LLR tables each corresponding to a retry attempt and the thresholds used for the retry attempt. The LLR table is not adjusted between retries or based on outcomes of any retries. A step size by which thresholds adjusted may be tuned to improve performance.


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