The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 08, 2019
Filed:
May. 19, 2017
Applicant:
Instec, Inc., Boulder, CO (US);
Inventors:
Henry Zhong Zou, Louisville, CO (US);
Lianhua Ji, Erie, CO (US);
Assignee:
Other;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/26 (2014.01); G02F 1/13 (2006.01); G01N 11/00 (2006.01); G02F 1/1343 (2006.01); G02F 1/00 (2006.01);
U.S. Cl.
CPC ...
G02F 1/1309 (2013.01); G01N 11/00 (2013.01); G02F 1/0045 (2013.01); G02F 1/134309 (2013.01); G02F 1/134363 (2013.01);
Abstract
Provided is a set of techniques for measuring different properties or parameters of liquid crystal mixtures by applying a driving waveform and measuring the response current and/or the optical response. This may be done by using specific liquid crystal test cells. Also provided are the optimized test cell parameters that are used in the algorithms for calculating the properties.
Zou, Henry. (2019). Measurement techniques for liquid crystal parameters including twist elastic constant with light measurement (U.S. Patent No. 10175511). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10175511
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile