The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 08, 2019

Filed:

May. 13, 2015
Applicant:

Georgetown University, Washington, DC (US);

Inventors:

Chen-Yong Lin, Falls Church, VA (US);

Michael D. Johnson, Rockville, MD (US);

Feng-Pai Chou, Kaohsiung, TW;

Assignee:

Georgetown University, Washington, DC (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
C12Q 1/37 (2006.01); G01N 33/573 (2006.01); G01N 33/574 (2006.01);
U.S. Cl.
CPC ...
G01N 33/573 (2013.01); C12Q 1/37 (2013.01); G01N 33/57426 (2013.01); G01N 2333/96433 (2013.01); G01N 2800/52 (2013.01);
Abstract

The present invention relates to methods of determining the presence or absence of abnormal lymphoid cells or abnormal myeloid cells in a cell sample, with the methods comprising subjecting the cell sample to conditions that will activate any inactive matriptase present in the cell sample and measuring the levels of activated matriptase in the cell sample. Once measured, these levels can then be compared to control levels of active matriptase to determine if the cell sample has elevated levels of activated matriptase over control levels of active matriptase. An elevation in the levels of activated matriptase in the cell sample is indicative that the cell sample contains abnormal lymphoid cells or abnormal myeloid cells.


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