The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 08, 2019
Filed:
May. 21, 2015
Applicant:
Prime Photonics, Lc, Blacksburg, VA (US);
Inventors:
Clark Davis Boyd, Portsmouth, VA (US);
David Todd Gray, Blacksburg, VA (US);
Jonathan Drapala Sides, Leonardtown, MD (US);
Assignee:
Prime Photonics, LC, Blacksburg, VA (US);
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 27/82 (2006.01); G01N 1/28 (2006.01);
U.S. Cl.
CPC ...
G01N 27/82 (2013.01); G01N 1/28 (2013.01);
Abstract
Methods of detecting non-uniformities in a material are described. Such methods can comprise inducing changes in strain state or changing the magnetic moment of a material and measuring magnetic flux leakage that is synchronous with the changes in strain state or magnetic moment, while simultaneously applying an external magnetic field to control the relative magnitude of the magnetic flux leakage.