The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 08, 2019

Filed:

Jun. 02, 2016
Applicant:

Moxtek, Inc., Orem, UT (US);

Inventors:

Richard Creighton, Orem, UT (US);

Steven Morris, Provo, UT (US);

Shawn Chin, Payson, UT (US);

Sanjay Kamtekar, Highland, UT (US);

Assignee:

Moxtek, Inc., Orem, UT (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/223 (2006.01); H01J 35/24 (2006.01);
U.S. Cl.
CPC ...
G01N 23/223 (2013.01); G01N 2223/317 (2013.01); H01J 35/24 (2013.01);
Abstract

The invention includes an XRF analyzer with reduced x-ray attenuation between sample and target and between sample and detector. Attenuation can be reduced by removing atmospheric-air paths through which the x-rays must travel. Reduced x-ray attenuation can allow for easier detection of low-atomic-number elements. Cost saving can be achieved by reducing the number of x-ray windows.


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