The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 08, 2019
Filed:
Dec. 22, 2015
Grandpect Company Limited, Beijing, CN;
Nuctech Company Limited, Beijing, CN;
Yongshun Xiao, Beijing, CN;
Zhiqiang Chen, Beijing, CN;
Ming Chang, Beijing, CN;
Ziran Zhao, Beijing, CN;
Grandpect Company Limited, Beijing, CN;
Nuctech Company Limited, Beijing, CN;
Abstract
A CT detection method is provided, comprising the steps of: (1) scanning circumferentially an object to be detected by means of X-ray according to a preset angle sampling value, which represents the number of sampling points in one circle, so as to obtain a group of projection sampling data in different projection angles, the preset angle sampling value being greater than 1000; (2) processing the projection sampling data so as to obtain projection data of a plurality of virtual sub-focuses equivalent to a large focus of radiation source in a CT system; and (3) implementing an image reconstruction according to the projection data of the plurality of virtual sub-focuses.