The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 08, 2019

Filed:

Jul. 21, 2015
Applicants:

Universite Grenoble Alpes, Saint Martin d'Hères, FR;

Surgiqual Institute, La Tronche, FR;

Inventors:

Philippe Cinquin, St. Nazaire les Eymes, FR;

Laurent Desbat, La Tronche, FR;

Yannick Grondin, Challes les Eaux, FR;

Assignees:

UNIVERSITE GRENOBLE ALPES, Saint Martin d'Heres, FR;

SURGIQUAL INSTITUTE, La Tronche, FR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/00 (2006.01); G01N 23/04 (2018.01); G06T 11/00 (2006.01); G21K 1/02 (2006.01); A61B 6/06 (2006.01);
U.S. Cl.
CPC ...
G01N 23/04 (2013.01); A61B 6/06 (2013.01); A61B 6/4035 (2013.01); A61B 6/4441 (2013.01); A61B 6/5282 (2013.01); A61B 6/582 (2013.01); G06T 11/005 (2013.01); G21K 1/025 (2013.01); G01N 2223/303 (2013.01);
Abstract

The invention relates to an X-ray imaging system wherein images are obtained using an X-ray blocking element, the system comprising means for determining a position of the detector () on the basis of coordinates of projected patterns of the blocker () in an image in order to especially be able to perform a calibration and/or correct the contribution of the scatter radiation in a radiographic image obtained by the system.


Find Patent Forward Citations

Cinquin, Philippe. (2019). X-ray imaging system allowing the correction of the scatter radiation and precise detection of the distance between the source and the detector (U.S. Patent No. 10175181). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10175181

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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