The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 08, 2019
Filed:
Jul. 18, 2017
Novartis Ag, Basel, CH;
Thomas Tonn, Aschaffenburg, DE;
Novartis AG, Basel, CH;
Abstract
A method for inspecting an ophthalmic lens, such as a contact lens, using Optical Coherence Tomography. The method includes illuminating a sample volume including the lens with a sample light beam which is provided from a light source having a power of at least 2 mW at a wavelength of 1040 nm to 1080 nm and which does not exceed 5 W. In carrying out the method an ophthalmic lens is inspected which has been manufactured such that it comprises scattering centers embedded in and/or on an anterior surface and in and/or on a posterior surface thereof, respectively, and/or distributed throughout a bulk material being delimited by the anterior surface and the posterior surface of the ophthalmic lens. An interference pattern resulting from a superposition of back-scattered light from the sample volume including the ophthalmic lens and a reference light beam provided from the light source may then be analyzed and evaluated.