The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 08, 2019

Filed:

Jun. 27, 2016
Applicant:

Exfo Inc., Québec, CA;

Inventors:

Denis Lafrance, Québec, CA;

Bernard Ruchet, Québec, CA;

Robert Baribault, Québec, CA;

Assignee:

EXFO Inc., Quebec, CA;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/00 (2006.01); G01M 11/00 (2006.01); G06T 7/00 (2017.01); H04N 5/225 (2006.01); H04B 10/00 (2013.01); G02B 6/38 (2006.01); G02B 21/00 (2006.01);
U.S. Cl.
CPC ...
G01M 11/30 (2013.01); G02B 6/385 (2013.01); G02B 6/3885 (2013.01); G02B 21/0016 (2013.01); G06T 7/0004 (2013.01); H04B 10/12 (2013.01); H04N 5/2251 (2013.01); G06T 2207/10056 (2013.01); H04N 2005/2255 (2013.01);
Abstract

An inspection system for inspecting a multiple-fiber connector is provided. The inspection system includes a microscope probe and a probe tip configured to provide an optical path between the microscope probe and the multiple-fiber connector. The probe tip and microscope probe are configured so that the field of view of the microscope probe is sufficiently large to cover a portion of the connector surface encompassing a plurality of the optical fiber endfaces. The system further includes a shifting mechanism operable to shift the field of view of the microscope probe between at least two discrete positions over the connector surface. Each discrete position encompasses a different subset of the multiple optical fiber endfaces and optionally at least one positioning reference. A probe tip and a method of inspection are also provided.


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