The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 08, 2019
Filed:
Sep. 18, 2015
Onera (Office National D'etudes ET DE Recherches Aerospatiales), Palaiseau, FR;
Cindy Bellanger, Massy, FR;
Maxime Deprez, Grougis, FR;
Laurent Lombard, Paris, FR;
Jerome Primot, Chatillon, FR;
ONERA (OFFICE NATIONAL D'ETUDES ET DE RECHERCHES AEROSPATIALES), Palaiseau, FR;
Abstract
A wavefront analyzer is modified to simply determine the differences in amplitude and tilt which can exist between the different regions of an initial wavefront (S). To achieve this, interference between two waves only is produced from beams (F, F) which come from neighboring regions on the initial wavefront. Such an analyzer can be used to coherently combine laser radiation produced by different sources arranged in parallel. Another use is for the determination of the differences in height and inclination which exist between the neighboring mirror segments of a Keck telescope.