The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 08, 2019
Filed:
Dec. 05, 2014
Applicant:
Rijk Zwaan Zaadteelt En Zaadhandel B.v., De Lier, NL;
Inventor:
Cornelis Maria Petrus Van Dun, Roosendaal, NL;
Assignee:
RIJK ZWAAN ZAADTEELT EN ZAADHANDEL B.V., De Lier, NL;
Primary Examiner:
Int. Cl.
CPC ...
C12Q 1/68 (2018.01); C12Q 1/6874 (2018.01); A01H 1/04 (2006.01); C12Q 1/6806 (2018.01); C12Q 1/6895 (2018.01); C12N 15/10 (2006.01);
U.S. Cl.
CPC ...
C12Q 1/6874 (2013.01); A01H 1/04 (2013.01); C12N 15/1003 (2013.01); C12Q 1/6806 (2013.01); C12Q 1/6895 (2013.01); C12Q 2600/13 (2013.01);
Abstract
The present invention relates to a non-destructive method for analyzing maternal DNA of a seed. In this method the DNA may be dislodged from the seed coat surface and may be used to collect information on the genome of the maternal parent of the seed. Also, the present invention provides a high throughput DNA analysis system for large plant populations.
Quick Actions:
Van Dun, Cornelis Maria Petrus. (2019). Method for analyzing maternal dna in large plant populations (U.S. Patent No. 10174370). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10174370
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile