The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 08, 2019

Filed:

Jul. 28, 2016
Applicant:

Denso Corporation, Kariya, Aichi-pref., JP;

Inventors:

Takaharu Kozawa, Kariya, JP;

Shuji Kuramitsu, Kariya, JP;

Kouichi Nakamura, Kariya, JP;

Masaya Taki, Kariya, JP;

Toshimitsu Sakai, Kariya, JP;

Katsuhiko Hayashi, Kariya, JP;

Assignee:

DENSO CORPORATION, Kariya, Aichi-Pref., JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B62D 5/04 (2006.01); B62D 6/10 (2006.01); G01L 3/10 (2006.01); G01L 25/00 (2006.01); G01D 18/00 (2006.01);
U.S. Cl.
CPC ...
B62D 5/049 (2013.01); B62D 5/0463 (2013.01); B62D 6/10 (2013.01); G01D 18/00 (2013.01); G01L 3/101 (2013.01); G01L 25/00 (2013.01);
Abstract

A sensor device includes two sensor parts and an ECU. An output division of one of the two sensor parts stops output of an output signal when a detected internal abnormality is a first abnormality. Further, when the detected internal abnormality is a second abnormality that is different from the first abnormality, the output division controls an abnormality signal to take a value indicative of the second abnormality. An abnormality determiner determines either of a signal obtainment abnormality or the first abnormality of the sensor part when the output signal is not obtained from the one of the sensor parts, or determines the second abnormality of the one of the sensor parts when the obtained output signal includes the abnormality signal having a value indicative of the second abnormality. Such determination, thus, enables the abnormality determiner to classify an abnormality caused in the sensor parts.


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