The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 08, 2019

Filed:

Dec. 03, 2014
Applicant:

Koninklijke Philips N.v., Eindhoven, NL;

Inventors:

Ewald Roessl, Hamburg, DE;

Hendrik Albert Pastink, Eindhoven, NL;

Thomas Koehler, Hamburg, DE;

Heiner Daerr, Hamburg, DE;

Udo Van Stevendaal, Hamburg, DE;

Gerhard Martens, Hamburg, DE;

Assignee:

KONINKLIJKE PHILIPS N.V., Eindhoven, NL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G21K 1/06 (2006.01); A61B 6/00 (2006.01); G21K 1/04 (2006.01); A61B 6/03 (2006.01); A61B 6/06 (2006.01);
U.S. Cl.
CPC ...
A61B 6/484 (2013.01); A61B 6/03 (2013.01); A61B 6/06 (2013.01); A61B 6/4291 (2013.01); A61B 6/502 (2013.01); A61B 6/585 (2013.01); A61B 6/587 (2013.01); G21K 1/04 (2013.01); G21K 2207/005 (2013.01);
Abstract

A phase contrast imaging apparatus (MA) and related image processing method. The imaging apparatus includes a movable arm (AR) that carries a detector (D) and one or more interferometric gratings (G,G,G). The imaging apparatus includes a rigidizer (RGD) to control the rigidity of at least the arm (AR) or a mounting (GM) for the gratings (G,G,G). This allows controlling a drift of a Moiré pattern as detected in a sequence of readouts. A phase of the so controlled Moiré pattern can be used to calibrate the imaging apparatus by using the image processing method.


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